Local voltage drop in a single functionalized graphene sheet characterized by Kelvin probe force microscopy.

Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy

Kelvin probe force microscopy was used to study the impact of contacts and topography on the local potential distribution on contacted, individual functionalized graphene sheets (FGS) deposited on a SiO2/Si substrate. Negligible contact resistance is found at the graphene/Ti interface and a graphene resistance of 2.3 kΩ is extracted for a single sheet with sub-μm size. Pronounced steps in the t...

Supporting Information Local transport measurements in Graphene on SiO2 using Kelvin Probe Force Microscopy

Graphene on Mica - Intercalated Water Trapped for Life

In this work we study the effect of thermal processing of exfoliated graphene on mica with respect to changes in graphene morphology and surface potential. Mild annealing to temperatures of about 200°C leads to the removal of small amounts of intercalated water at graphene edges. By heating to 600°C the areas without intercalated water are substantially increased enabling a quantification of th...

Epitaxial Graphene and Graphene–Based Devices Studied by Electrical Scanning Probe Microscopy

We present local electrical characterization of epitaxial graphene grown on both Siand C-faces of 4H-SiC using Electrostatic Force Microscopy and Kelvin Probe Force Microscopy in ambient conditions and at elevated temperatures. These techniques provide a straightforward identification of graphene domains with various thicknesses on the substrate where topographical determination is hindered by ...

Functionalized single graphene sheets derived from splitting graphite oxide.

A process is described to produce single sheets of functionalized graphene through thermal exfoliation of graphite oxide. The process yields a wrinkled sheet structure resulting from reaction sites involved in oxidation and reduction processes. The topological features of single sheets, as measured by atomic force microscopy, closely match predictions of first-principles atomistic modeling. Alt...